Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology 1 — EPFL
- Località
- Villigen
- Contratto
- full-time
- Pubblicato
- Ieri
Panoramica
Mission
The performance of X-ray microscopy has improved significantly over the last decade, enabling synchrotron-based X-ray imaging to resolve individual transistors in modern semiconductor devices.
As the industry moves to 3D transistor architectures and stacked, hybrid-bonded devices, it becomes important to study the initiation and propagation of defects due to thermal and electrical phenomena (e.g., dielectric breakdown or electromigration).
- Mission
- The performance of X-ray microscopy has improved significantly over the last decade, enabling synchrotron-based X-ray imaging to resolve individual transistors in modern semiconductor devices.
- Main duties and responsibilities
- You will develop an acquisition and reconstruction framework that exploits sparsity of the underlying dynamics and microchip sample structure to detect nanoscale sample changes from the smallest possible number of X-ray measurements.
Responsabilità principali
- Main duties and responsibilities
- You will develop an acquisition and reconstruction framework that exploits sparsity of the underlying dynamics and microchip sample structure to detect nanoscale sample changes from the smallest possible number of X-ray measurements.
- Our pipeline reconstructs each projection from thousands of diffraction patterns, followed by volume reconstruction from projections measured at many rotation angles.
- These are two inverse problems, each with its own sampling requirements that can be significantly relaxed through sparsity. The questions we want to answer:
- How temporal and structural sparsity can be incorporated into the 3D dynamics reconstruction model?
- How sparse can a measurement be and still capture a high-resolution dynamic event?
- How do temporal resolution, spatial resolution, and radiation dose trade against one another, and what semiconductor dynamics can be observed?
- The primary focus will be on algorithm development, followed by their demonstration at synchrotron experiments.
- You will start working with an existing data acquisition and reconstruction pipeline which will be improved and extended for semiconductor imaging.
- You will also get a chance to perform experiments at the cSAXS beamline of the upgraded Swiss Light Source synchrotron, as well as other facilities around the world. Profile We are looking for a person with:
Processo di candidatura
- The newly established Laboratory for Nanoscale X-ray Metrology is looking for a motivated postdoctoral researcher to develop time-resolved imaging methods and apply them to semiconductor reliability problems.
- We also value applications from people with the following experience (or similar):
- Coherent diffractive imaging, especially ptychography.
- Sparse sensing, optimization, or Bayesian experimental design.
- Machine learning for imaging.
- Synchrotron experiment experience.
- Semiconductor devices or metrology. We offer You will be employed by
Dettagli ulteriori
- These are two inverse problems, each with its own sampling requirements that can be significantly relaxed through sparsity. The questions we want to answer:
- You will also get a chance to perform experiments at the cSAXS beamline of the upgraded Swiss Light Source synchrotron, as well as other facilities around the world. We are looking for a person with:
- Semiconductor devices or metrology. You will be employed by
Note e contenuto originale
- These are two inverse problems, each with its own sampling requirements that can be significantly relaxed through sparsity.
- The questions we want to answer:
- You will also get a chance to perform experiments at the cSAXS beamline of the upgraded Swiss Light Source synchrotron, as well as other facilities around the world.
- We are looking for a person with:
- Semiconductor devices or metrology.
- You will be employed by
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Che stipendio offre EPFL per questa posizione?
EPFL indica CHF 62'000 - 94'000 lordi annui per questo ruolo a Villigen. Questo è lo stipendio pubblicato nell'annuncio originale (o, quando il datore non specifica una cifra, una stima realistica per ruolo e settore) — il calcolatore di questo sito lo converte nel netto reale una volta applicate imposta da frontaliere e contributi sociali.
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